Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505

R.S. Lee; R. Pethig; M.S. Talary

Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505

R.S. Lee (Dyfeisiwr)
, R. Pethig (Dyfeisiwr)
, M.S. Talary (Dyfeisiwr)

Allbwn ymchwil: Patent

Iaith wreiddiol	Saesneg
Rhif y patent	US 7,063,777 B1
Statws	Cyhoeddwyd - 1 Ion 2006

Ffeiliau eraill a chysylltiadau

http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=7,063,777.PN.&OS=PN/7,063,777&RS=PN/7,063,777

Dyfynnu hyn

TY - PAT

T1 - Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505

AU - Lee, R.S.

AU - Pethig, R.

AU - Talary, M.S.

PY - 2006/1/1

Y1 - 2006/1/1

UR - http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=7,063,777.PN.&OS=PN/7,063,777&RS=PN/7,063,777

M3 - Patent

M1 - US 7,063,777 B1

ER -