Regression-based developmental models exemplified for Wisconsin Card Sorting Test parameters: Statistics and software for individual predictions.

C. Klein; F. Foerster; K. Hartnegg

doi:10.1080/13803390500276859

Regression-based developmental models exemplified for Wisconsin Card Sorting Test parameters: Statistics and software for individual predictions.

C. Klein
, F. Foerster
, K. Hartnegg

Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

Iaith wreiddiol	Saesneg
Tudalennau (o-i)	25-35
Cyfnodolyn	Journal of Clinical and Experimental Neuropsychology
Cyfrol	29
Rhif cyhoeddi	1
Dynodwyr Gwrthrych Digidol (DOIs)	https://doi.org/10.1080/13803390500276859
Statws	Cyhoeddwyd - 1 Ion 2007

Mynediad at Ddogfen

10.1080/13803390500276859

Dyfynnu hyn

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title = "Regression-based developmental models exemplified for Wisconsin Card Sorting Test parameters: Statistics and software for individual predictions.",

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author = "C. Klein and F. Foerster and K. Hartnegg",

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