INSA-Lyon

  • Mitchell, I. (Visiting researcher)
  • Vidal, F. (Visiting researcher)
  • Jean-Yves Buffière (Visiting researcher)
  • J.M. Letang (Visiting researcher)

Activity: Visiting an external institutionVisiting an external academic institution

Description

Collaborative Research on X-ray CT Digital Shadows, X-ray Noise Models, Detector Scintillator Simulations, and Scanning Defects.
Period26 Jun 202321 Jul 2023
VisitingINSA-Lyon
Degree of RecognitionInternational