Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches

D. Molinero; C. Palego; S. Halder; X. Luo; A. Hallden-Abberton; J. Hwang; C.L. Goldsmith

doi:10.1109/MWSYM.2011.5972588

Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches

D. Molinero, C. Palego, S. Halder, X. Luo, A. Hallden-Abberton, J. Hwang, C.L. Goldsmith

Research output: Contribution to conference › Paper

Abstract

RF power, when approaching the handling capacity of microelectromechanical capacitive switches, was found to accelerate both the charging and discharging of the dielectric in the switches. The amount of acceleration appeared to be greater than what could be explained by self biasing and self heating. Since the long-term reliability of the switches is limited by dielectric charging, the RF power-handling capacity of the switches may have to be derated to ensure long-term reliability.

Original language	English
DOIs	https://doi.org/10.1109/MWSYM.2011.5972588
Publication status	Published - 5 Jun 2011
Event	Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011 - Duration: 3 Jan 0001 → …

Conference

Conference	Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011
Period	3/01/01 → …

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10.1109/MWSYM.2011.5972588

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Molinero, D., Palego, C., Halder, S., Luo, X., Hallden-Abberton, A., Hwang, J., & Goldsmith, C. L. (2011). Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches. Paper presented at Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011. https://doi.org/10.1109/MWSYM.2011.5972588

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title = "Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches",

abstract = "RF power, when approaching the handling capacity of microelectromechanical capacitive switches, was found to accelerate both the charging and discharging of the dielectric in the switches. The amount of acceleration appeared to be greater than what could be explained by self biasing and self heating. Since the long-term reliability of the switches is limited by dielectric charging, the RF power-handling capacity of the switches may have to be derated to ensure long-term reliability.",

author = "D. Molinero and C. Palego and S. Halder and X. Luo and A. Hallden-Abberton and J. Hwang and C.L. Goldsmith",

year = "2011",

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doi = "10.1109/MWSYM.2011.5972588",

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note = "Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011 ; Conference date: 03-01-0001",

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Molinero, D, Palego, C, Halder, S, Luo, X, Hallden-Abberton, A, Hwang, J & Goldsmith, CL 2011, 'Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches', Paper presented at Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011, 3/01/01. https://doi.org/10.1109/MWSYM.2011.5972588

TY - CONF

T1 - Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches

AU - Molinero, D.

AU - Palego, C.

AU - Halder, S.

AU - Luo, X.

AU - Hallden-Abberton, A.

AU - Hwang, J.

AU - Goldsmith, C.L.

PY - 2011/6/5

Y1 - 2011/6/5

N2 - RF power, when approaching the handling capacity of microelectromechanical capacitive switches, was found to accelerate both the charging and discharging of the dielectric in the switches. The amount of acceleration appeared to be greater than what could be explained by self biasing and self heating. Since the long-term reliability of the switches is limited by dielectric charging, the RF power-handling capacity of the switches may have to be derated to ensure long-term reliability.

AB - RF power, when approaching the handling capacity of microelectromechanical capacitive switches, was found to accelerate both the charging and discharging of the dielectric in the switches. The amount of acceleration appeared to be greater than what could be explained by self biasing and self heating. Since the long-term reliability of the switches is limited by dielectric charging, the RF power-handling capacity of the switches may have to be derated to ensure long-term reliability.

U2 - 10.1109/MWSYM.2011.5972588

DO - 10.1109/MWSYM.2011.5972588

M3 - Paper

T2 - Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011

Y2 - 3 January 0001

ER -

Acceleration of dielectric charging/discharging by RF power in microelectromechanical capacitive switches

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