Electro-thermal analysis of RF MEM capacitive switches for high-power applications

F. Solazzi, C. Palego, S. Halder, J. Hwang, A. Faes, V. Mulloni, B. Margesin, P. Farinelli, R. Sorrentino

    Research output: Contribution to conferencePaper

    Abstract

    Self heating in electrostatically actuated RF MEM capacitive shunt switches is analyzed by coupled electrical and thermal simulations using three-dimensional finite-element analysis. The result shows that despite highly nonuniform current and temperature distributions, the self-heating effect can be approximated by lumped thermal resistances of the switch membrane and the substrate. Additionally, since the thermal resistance of thermally insulating substrates such as quartz is significant compared to that of the membrane, it is important to consider the heat transfer across both the membrane and the substrate.
    Original languageEnglish
    Pages468-471
    DOIs
    Publication statusPublished - 14 Sept 2010
    EventProceedings of the EuropeanSolid-State Device Research Conference (ESSDERC), Sevilla, 2010 -
    Duration: 3 Jan 0001 → …

    Conference

    ConferenceProceedings of the EuropeanSolid-State Device Research Conference (ESSDERC), Sevilla, 2010
    Period3/01/01 → …

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