Error-dependency relationships for the Naive Bayes classifier with binary features

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	735-740
Journal	IEEE Transactions on Pattern Analysis and Machine Intelligence
Volume	30
Issue number	4
DOIs	https://doi.org/10.1109/TPAMI.2007.70845 https://doi.org/10.1109/TPAMI.2007.70845
Publication status	Published - 1 Apr 2008

Keywords

@article{693a16a099ba458fa237136cb844fefa,

title = "Error-dependency relationships for the Naive Bayes classifier with binary features",

keywords = "COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE, ENGINEERING, ELECTRICAL \& ELECTRONIC",

author = "Ludmila Kuncheva and Z.S. Hoare",

year = "2008",

month = apr,

day = "1",

doi = "10.1109/TPAMI.2007.70845",

language = "English",

volume = "30",

pages = "735--740",

journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",

issn = "0162-8828",

publisher = "IEEE Computer Society",

number = "4",

}

TY - JOUR

T1 - Error-dependency relationships for the Naive Bayes classifier with binary features

AU - Kuncheva, Ludmila

AU - Hoare, Z.S.

PY - 2008/4/1

Y1 - 2008/4/1

KW - COMPUTER SCIENCE

KW - ARTIFICIAL INTELLIGENCE

KW - ENGINEERING

KW - ELECTRICAL & ELECTRONIC

U2 - 10.1109/TPAMI.2007.70845

DO - 10.1109/TPAMI.2007.70845

M3 - Article

SN - 0162-8828

VL - 30

SP - 735

EP - 740

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

IS - 4

ER -