In situ thin film stress, measurements - a path to understanding the structure and morphology of electron beam evaporated ZnS

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	W10.8-1-6
Journal	Materials Research Society Proceedings
Volume	749
Publication status	Published - 1 Jan 2003

Cite this

@article{aff3a40d28d141928a3671cb45142148,

title = "In situ thin film stress, measurements - a path to understanding the structure and morphology of electron beam evaporated ZnS",

author = "V. Barrioz and S.J. Irvine and D.P. Jones",

year = "2003",

month = jan,

day = "1",

language = "English",

volume = "749",

pages = "W10.8--1--6",

journal = "Materials Research Society Proceedings",

}