Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.

M.F. Mabrook, A.S. Jombert, S.E. Machin, C. Pearson, D. Kolb, K.S. Coleman, D.A. Zeze, M.C. Petty

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	14-17
Journal	Materials Science and Engineering B
Volume	159-160
DOIs	https://doi.org/10.1016/j.mseb.2008.09.003
Publication status	Published - 15 Mar 2009

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title = "Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.",

author = "M.F. Mabrook and A.S. Jombert and S.E. Machin and C. Pearson and D. Kolb and K.S. Coleman and D.A. Zeze and M.C. Petty",

year = "2009",

month = mar,

day = "15",

doi = "10.1016/j.mseb.2008.09.003",

language = "English",

volume = "159-160",

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journal = "Materials Science and Engineering B",

issn = "0921-5107",

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T1 - Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.

AU - Mabrook, M.F.

AU - Jombert, A.S.

AU - Machin, S.E.

AU - Pearson, C.

AU - Kolb, D.

AU - Coleman, K.S.

AU - Zeze, D.A.

AU - Petty, M.C.

PY - 2009/3/15

Y1 - 2009/3/15

U2 - 10.1016/j.mseb.2008.09.003

DO - 10.1016/j.mseb.2008.09.003

M3 - Article

SN - 0921-5107

VL - 159-160

SP - 14

EP - 17

JO - Materials Science and Engineering B

JF - Materials Science and Engineering B

ER -