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Monitoring Deformation in Graphene Through Hyperspectral Synchrotron Spectroscopy to Inform Fabrication

  • Allen Winter
  • , Wudmir Rojas
  • , Adrienne D. Williams
  • , Steve S. Kim
  • , Fahima Ouchen
  • , Daniel A. Fisher
  • , Conan Weiland
  • , Edward Principe
  • , Sarbajit Banerjee
  • , Chuong Huynh
  • , Rajesh R. Naik
  • , Yijin Liu
  • , Apurva Mehta
  • , James Grote
  • , David Predergast
  • , Eva Campo
    • Air Force Research Laboratory
    • National Institute of Standards and Technology
    • Synchrotron Research Inc
    • Texas A&M University
    • Carl Zeiss Microscopy LLC, Thornwood, NY
    • Stanford University
    • Lawrence Berkeley National Laboratory
    • University of Texas at San Antonio

    Research output: Contribution to journalArticlepeer-review

    416 Downloads (Pure)
    Original languageEnglish
    Pages (from-to)15653-15664
    JournalJournal of Physical Chemistry C
    Volume121
    Issue number29
    Early online date30 Jun 2017
    DOIs
    Publication statusPublished - 2017

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