Observation of strong CW room temperature and low temperature emission (1.56 um at 4K) in highly strained InGaAs/InAlAs QC structures operating under reverse operational bias

C.J. Mitchell; J.L. Sly; M. Missous; S. Banerjee; K.A. Shore

Observation of strong CW room temperature and low temperature emission (1.56 um at 4K) in highly strained InGaAs/InAlAs QC structures operating under reverse operational bias

C.J. Mitchell
, J.L. Sly
, M. Missous
, S. Banerjee
, K.A. Shore

Research output: Contribution to conference › Paper

Original language	English
Publication status	Published - 1 Apr 2003
Event	Semiconductor and Integrated Optoelectronics 03, Cardiff, Wales, UK - Duration: 3 Jan 0001 → …

Conference

Conference	Semiconductor and Integrated Optoelectronics 03, Cardiff, Wales, UK
Period	3/01/01 → …

Cite this

@conference{b46a429fd03e42eb9d0dbbdba3d45320,

title = "Observation of strong CW room temperature and low temperature emission (1.56 um at 4K) in highly strained InGaAs/InAlAs QC structures operating under reverse operational bias",

author = "C.J. Mitchell and J.L. Sly and M. Missous and S. Banerjee and K.A. Shore",

year = "2003",

month = apr,

day = "1",

language = "English",

note = "Semiconductor and Integrated Optoelectronics 03, Cardiff, Wales, UK ; Conference date: 03-01-0001",

}

Observation of strong CW room temperature and low temperature emission (1.56 um at 4K) in highly strained InGaAs/InAlAs QC structures operating under reverse operational bias. / Mitchell, C.J.; Sly, J.L.; Missous, M. et al.
2003. Paper presented at Semiconductor and Integrated Optoelectronics 03, Cardiff, Wales, UK.

Research output: Contribution to conference › Paper

TY - CONF

T1 - Observation of strong CW room temperature and low temperature emission (1.56 um at 4K) in highly strained InGaAs/InAlAs QC structures operating under reverse operational bias

AU - Mitchell, C.J.

AU - Sly, J.L.

AU - Missous, M.

AU - Banerjee, S.

AU - Shore, K.A.

PY - 2003/4/1

Y1 - 2003/4/1

M3 - Paper

T2 - Semiconductor and Integrated Optoelectronics 03, Cardiff, Wales, UK

Y2 - 3 January 0001

ER -