Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors

Research output: Contribution to journal › Article › peer-review

Keywords

@article{13a9f2600d184d789ace4eefafb11eec,

title = "Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors",

keywords = "PHYSICS, APPLIED",

author = "D.M. Taylor and N. Alves",

year = "2008",

month = mar,

day = "10",

doi = "10.1063/1.2844435",

language = "English",

volume = "103",

pages = "054509",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors

AU - Taylor, D.M.

AU - Alves, N.

PY - 2008/3/10

Y1 - 2008/3/10

KW - PHYSICS

KW - APPLIED

U2 - 10.1063/1.2844435

DO - 10.1063/1.2844435

M3 - Article

SN - 0021-8979

VL - 103

SP - 054509

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

ER -