Super-Enhancement Focusing of Teflon Spheres

Liyang Yue; James  Wang; Bing Yan; James Monks; Yasir Joya; Rakesh Dhama; Oleg Minin; Igor Minin

doi:10.1002/andp.202000373

Super-Enhancement Focusing of Teflon Spheres

Liyang Yue
, James Wang
, Bing Yan
, James Monks
, Yasir Joya
, Rakesh Dhama
, Oleg Minin
, Igor Minin

School of Computer Science & Engineering

National Research Tomsk Polytechnic University

Research output: Contribution to journal › Article › peer-review

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Abstract

A Teflon (Polytetrafluoroethylene, PTFE) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz (THz) band. In this paper, we analytically calculated field intensities and focusing parameters for Teflon spheres at different low-loss levels and then discovered a super-enhancement focusing effect in the spheres with particular size parameters, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proved that the strong scattering of a single order mode in the internal electric or magnetic field is the main factor causing this phenomenon.

Original language	English
Article number	2000373
Journal	Annalen der Physik
Volume	532
Issue number	10
Early online date	8 Sept 2020
DOIs	https://doi.org/10.1002/andp.202000373
Publication status	Published - 9 Oct 2020

Keywords

Mie theory
Teflon spheres
dielectric particles
low-loss materials
near-field focusing

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10.1002/andp.202000373

Teflon jet 2020_ADP_LY_blackAccepted author manuscript, 11 MBLicence: Unspecified

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title = "Super-Enhancement Focusing of Teflon Spheres",

abstract = "A Teflon (Polytetrafluoroethylene, PTFE) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz (THz) band. In this paper, we analytically calculated field intensities and focusing parameters for Teflon spheres at different low-loss levels and then discovered a super-enhancement focusing effect in the spheres with particular size parameters, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proved that the strong scattering of a single order mode in the internal electric or magnetic field is the main factor causing this phenomenon. ",

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AU - Yue, Liyang

AU - Wang, James

AU - Yan, Bing

AU - Monks, James

AU - Joya, Yasir

AU - Dhama, Rakesh

AU - Minin, Oleg

AU - Minin, Igor

PY - 2020/10/9

Y1 - 2020/10/9

N2 - A Teflon (Polytetrafluoroethylene, PTFE) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz (THz) band. In this paper, we analytically calculated field intensities and focusing parameters for Teflon spheres at different low-loss levels and then discovered a super-enhancement focusing effect in the spheres with particular size parameters, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proved that the strong scattering of a single order mode in the internal electric or magnetic field is the main factor causing this phenomenon.

AB - A Teflon (Polytetrafluoroethylene, PTFE) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz (THz) band. In this paper, we analytically calculated field intensities and focusing parameters for Teflon spheres at different low-loss levels and then discovered a super-enhancement focusing effect in the spheres with particular size parameters, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proved that the strong scattering of a single order mode in the internal electric or magnetic field is the main factor causing this phenomenon.

KW - Mie theory

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KW - dielectric particles

KW - low-loss materials

KW - near-field focusing

U2 - 10.1002/andp.202000373

DO - 10.1002/andp.202000373

M3 - Article

SN - 1521-3889

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JO - Annalen der Physik

JF - Annalen der Physik

IS - 10

M1 - 2000373

ER -

Super-Enhancement Focusing of Teflon Spheres

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Keywords

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