Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions

Allbwn ymchwil: Cyfraniad at gyfnodolynErthygladolygiad gan gymheiriaid

StandardStandard

Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions. / Stoichkov, Vasil; Kumar, Dinesh; Tyagi, Priyanka et al.
Yn: IEEE Journal of Photovoltaics, Cyfrol 8, Rhif 4, 07.2018, t. 1058-1065.

Allbwn ymchwil: Cyfraniad at gyfnodolynErthygladolygiad gan gymheiriaid

HarvardHarvard

Stoichkov, V, Kumar, D, Tyagi, P & Kettle, J 2018, 'Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions', IEEE Journal of Photovoltaics, cyfrol. 8, rhif 4, tt. 1058-1065. https://doi.org/10.1109/JPHOTOV.2018.2838438

APA

Stoichkov, V., Kumar, D., Tyagi, P., & Kettle, J. (2018). Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions. IEEE Journal of Photovoltaics, 8(4), 1058-1065. https://doi.org/10.1109/JPHOTOV.2018.2838438

CBE

Stoichkov V, Kumar D, Tyagi P, Kettle J. 2018. Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions. IEEE Journal of Photovoltaics. 8(4):1058-1065. https://doi.org/10.1109/JPHOTOV.2018.2838438

MLA

VancouverVancouver

Stoichkov V, Kumar D, Tyagi P, Kettle J. Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions. IEEE Journal of Photovoltaics. 2018 Gor;8(4):1058-1065. Epub 2018 Meh 11. doi: 10.1109/JPHOTOV.2018.2838438

Author

Stoichkov, Vasil ; Kumar, Dinesh ; Tyagi, Priyanka et al. / Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions. Yn: IEEE Journal of Photovoltaics. 2018 ; Cyfrol 8, Rhif 4. tt. 1058-1065.

RIS

TY - JOUR

T1 - Multi stress testing of OPV modules for accurate predictive ageing and reliability predictions

AU - Stoichkov, Vasil

AU - Kumar, Dinesh

AU - Tyagi, Priyanka

AU - Kettle, Jeffrey

N1 - © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Funded by: Solar Photovoltaic Academic Research Consortium II project; WEFO

PY - 2018/7

Y1 - 2018/7

N2 - OPV degradation remains a complex challenge and previous studies have been shown the degradation to be a function of multiple stresses, so it can be inaccurate to predict failure rates using single stress tests. In this paper, a new testing methodology whereby multiple stresses are applied simultaneously using a ‘design of experiment (DOE) approach’ is reported and used for predictive ageing of modules. A multi-stress data is used for predictive ageing of OPV modules under different stress levels; a General-Log-Linear (GLL) life model has been adapted and applied in order to predict the life of OPV modules and this is compared to experimental data, which shows that a close estimation of simulated lifetime is obtained (within 18% accuracy). The life test models can be used for predicting ageing of OPV modules in different geographic locations and could be used to account for different degradation rates due to seasonal climatic variations. Furthermore, by using the DOE data, we show how the major stress factors can be screened and their statistical significance upon degradation quantified using ANOVA. One of the potential benefits of using this approach for OPV degradation studies is that additional factors could be added to study the impact on degradation to provide a more comprehensive study.

AB - OPV degradation remains a complex challenge and previous studies have been shown the degradation to be a function of multiple stresses, so it can be inaccurate to predict failure rates using single stress tests. In this paper, a new testing methodology whereby multiple stresses are applied simultaneously using a ‘design of experiment (DOE) approach’ is reported and used for predictive ageing of modules. A multi-stress data is used for predictive ageing of OPV modules under different stress levels; a General-Log-Linear (GLL) life model has been adapted and applied in order to predict the life of OPV modules and this is compared to experimental data, which shows that a close estimation of simulated lifetime is obtained (within 18% accuracy). The life test models can be used for predicting ageing of OPV modules in different geographic locations and could be used to account for different degradation rates due to seasonal climatic variations. Furthermore, by using the DOE data, we show how the major stress factors can be screened and their statistical significance upon degradation quantified using ANOVA. One of the potential benefits of using this approach for OPV degradation studies is that additional factors could be added to study the impact on degradation to provide a more comprehensive study.

U2 - 10.1109/JPHOTOV.2018.2838438

DO - 10.1109/JPHOTOV.2018.2838438

M3 - Article

VL - 8

SP - 1058

EP - 1065

JO - IEEE Journal of Photovoltaics

JF - IEEE Journal of Photovoltaics

SN - 2156-3381

IS - 4

ER -