On the measurement of the Pockels effect in strained silicon
Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid
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On the measurement of the Pockels effect in strained silicon. / Nezhad, M.; Azedeh, S.S.; Merget, F. et al.
Yn: Optics Letters, Cyfrol 40, Rhif 8, 15.04.2015, t. 1877-1880.
Yn: Optics Letters, Cyfrol 40, Rhif 8, 15.04.2015, t. 1877-1880.
Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid
HarvardHarvard
Nezhad, M, Azedeh, SS, Merget, F, Nezhad, MP & Witzens, J 2015, 'On the measurement of the Pockels effect in strained silicon', Optics Letters, cyfrol. 40, rhif 8, tt. 1877-1880. https://doi.org/10.1364/OL.40.001877
APA
Nezhad, M., Azedeh, S. S., Merget, F., Nezhad, M. P., & Witzens, J. (2015). On the measurement of the Pockels effect in strained silicon. Optics Letters, 40(8), 1877-1880. https://doi.org/10.1364/OL.40.001877
CBE
Nezhad M, Azedeh SS, Merget F, Nezhad MP, Witzens J. 2015. On the measurement of the Pockels effect in strained silicon. Optics Letters. 40(8):1877-1880. https://doi.org/10.1364/OL.40.001877
MLA
Nezhad, M. et al. "On the measurement of the Pockels effect in strained silicon". Optics Letters. 2015, 40(8). 1877-1880. https://doi.org/10.1364/OL.40.001877
VancouverVancouver
Nezhad M, Azedeh SS, Merget F, Nezhad MP, Witzens J. On the measurement of the Pockels effect in strained silicon. Optics Letters. 2015 Ebr 15;40(8):1877-1880. doi: 10.1364/OL.40.001877
Author
RIS
TY - JOUR
T1 - On the measurement of the Pockels effect in strained silicon
AU - Nezhad, M.
AU - Azedeh, S.S.
AU - Merget, F.
AU - Nezhad, M.P.
AU - Witzens, J.
PY - 2015/4/15
Y1 - 2015/4/15
U2 - 10.1364/OL.40.001877
DO - 10.1364/OL.40.001877
M3 - Article
VL - 40
SP - 1877
EP - 1880
JO - Optics Letters
JF - Optics Letters
SN - 0146-9592
IS - 8
ER -