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Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process

Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

StandardStandard

Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process. / Taylor, D.M.; Patchett, E.R.; Williams, A. et al.
Yn: IEEE Transactions on Electron Devices, Cyfrol 61, Rhif 8, 23.06.2014, t. 2950-2956.

Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

HarvardHarvard

Taylor, DM, Patchett, ER, Williams, A, Neto, NJ, Ding, Z, Assender, HE, Morrison, JJ & Yeates, SG 2014, 'Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process', IEEE Transactions on Electron Devices, cyfrol. 61, rhif 8, tt. 2950-2956. https://doi.org/10.1109/TED.2014.2329329

APA

Taylor, D. M., Patchett, E. R., Williams, A., Neto, N. J., Ding, Z., Assender, H. E., Morrison, J. J., & Yeates, S. G. (2014). Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process. IEEE Transactions on Electron Devices, 61(8), 2950-2956. https://doi.org/10.1109/TED.2014.2329329

CBE

Taylor DM, Patchett ER, Williams A, Neto NJ, Ding Z, Assender HE, Morrison JJ, Yeates SG. 2014. Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process. IEEE Transactions on Electron Devices. 61(8):2950-2956. https://doi.org/10.1109/TED.2014.2329329

MLA

Taylor, D.M. et al. "Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process". IEEE Transactions on Electron Devices. 2014, 61(8). 2950-2956. https://doi.org/10.1109/TED.2014.2329329

VancouverVancouver

Taylor DM, Patchett ER, Williams A, Neto NJ, Ding Z, Assender HE et al. Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process. IEEE Transactions on Electron Devices. 2014 Meh 23;61(8):2950-2956. doi: 10.1109/TED.2014.2329329

Author

Taylor, D.M. ; Patchett, E.R. ; Williams, A. et al. / Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process. Yn: IEEE Transactions on Electron Devices. 2014 ; Cyfrol 61, Rhif 8. tt. 2950-2956.

RIS

TY - JOUR

T1 - Organic Digital Logic and Analog Circuits Fabricated in a Roll-to-Roll Compatible Vacuum-Evaporation Process

AU - Taylor, D.M.

AU - Patchett, E.R.

AU - Williams, A.

AU - Neto, N.J.

AU - Ding, Z.

AU - Assender, H.E.

AU - Morrison, J.J.

AU - Yeates, S.G.

PY - 2014/6/23

Y1 - 2014/6/23

N2 - We report the fabrication of a range of organic circuits produced by a high-yielding, vacuum-based process compatible with roll-to-roll production. The circuits include inverters, NAND and NOR logic gates, a simple memory element (set-reset latch), and a modified Wilson current mirror circuit. The measured circuit responses are presented together with simulated responses based on a previously reported transistor model of organic transistors produced using our fabrication process. Circuit simulations replicated all the key features of the experimentally observed circuit performance. The logic gates were capable of operating at frequencies in excess of 1 kHz while the current mirror circuit produced currents up to 18 μA.

AB - We report the fabrication of a range of organic circuits produced by a high-yielding, vacuum-based process compatible with roll-to-roll production. The circuits include inverters, NAND and NOR logic gates, a simple memory element (set-reset latch), and a modified Wilson current mirror circuit. The measured circuit responses are presented together with simulated responses based on a previously reported transistor model of organic transistors produced using our fabrication process. Circuit simulations replicated all the key features of the experimentally observed circuit performance. The logic gates were capable of operating at frequencies in excess of 1 kHz while the current mirror circuit produced currents up to 18 μA.

U2 - 10.1109/TED.2014.2329329

DO - 10.1109/TED.2014.2329329

M3 - Article

VL - 61

SP - 2950

EP - 2956

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

SN - 0018-9383

IS - 8

ER -