Research Portal

Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation

Research output: Contribution to journal › Article › peer-review

Standard Standard

Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation. / Li, Hongqiang; Xie, Rui; Hong, Yanhua et al.
In: Optical Engineering, Vol. 57, No. 6, 27.06.2018.

Research output: Contribution to journal › Article › peer-review

HarvardHarvard

Li, H, Xie, R, Hong, Y, Zhang, Z, Zhang, C, Tang, C & Li, E 2018, 'Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation', Optical Engineering, vol. 57, no. 6. https://doi.org/10.1117/1.OE.57.6.065103

APA

Li, H., Xie, R., Hong, Y., Zhang, Z., Zhang, C., Tang, C., & Li, E. (2018). Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation. Optical Engineering, 57(6). https://doi.org/10.1117/1.OE.57.6.065103

CBE

Li H, Xie R, Hong Y, Zhang Z, Zhang C, Tang C, Li E. 2018. Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation. Optical Engineering. 57(6). https://doi.org/10.1117/1.OE.57.6.065103

MLA

Li, Hongqiang et al. "Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation". Optical Engineering. 2018. 57(6). https://doi.org/10.1117/1.OE.57.6.065103

VancouverVancouver

Li H, Xie R, Hong Y, Zhang Z, Zhang C, Tang C et al. Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation. Optical Engineering. 2018 Jun 27;57(6). doi: 10.1117/1.OE.57.6.065103

Author

Li, Hongqiang ; Xie, Rui ; Hong, Yanhua et al. / Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation. In: Optical Engineering. 2018 ; Vol. 57, No. 6.

RIS

TY - JOUR

T1 - Effect of polarization sensitivity on ultrasmall SOI-based AWG for FBG sensor interrogation

AU - Li, Hongqiang

AU - Xie, Rui

AU - Hong, Yanhua

AU - Zhang, Zanyun

AU - Zhang, Cheng

AU - Tang, Chunxiao

AU - Li, Enbang

N1 - Copyright 2018 Society of Photo Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.

PY - 2018/6/27

Y1 - 2018/6/27

U2 - 10.1117/1.OE.57.6.065103

DO - 10.1117/1.OE.57.6.065103

M3 - Article

VL - 57

JO - Optical Engineering

JF - Optical Engineering

SN - 0091-3286

IS - 6

ER -