Error-dependency relationships for the Naive Bayes classifier with binary features
Research output: Contribution to journal › Article › peer-review
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DOI
Keywords
- COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE, ENGINEERING, ELECTRICAL & ELECTRONIC
| Original language | English |
|---|---|
| Pages (from-to) | 735-740 |
| Journal | IEEE Transactions on Pattern Analysis and Machine Intelligence |
| Volume | 30 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1 Apr 2008 |