In situ thin film stress, measurements - a path to understanding the structure and morphology of electron beam evaporated ZnS
Research output: Contribution to journal › Article › peer-review
| Original language | English |
|---|---|
| Pages (from-to) | W10.8-1-6 |
| Journal | Materials Research Society Proceedings |
| Volume | 749 |
| Publication status | Published - 1 Jan 2003 |