Intelligent CMOS control of RF MEMS capacitive switches
Research output: Contribution to conference › Paper
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2012. Paper presented at Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International, Montreal, 17-22 June 2012.
Research output: Contribution to conference › Paper
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TY - CONF
T1 - Intelligent CMOS control of RF MEMS capacitive switches
AU - Ding, G.
AU - Wang, W.
AU - Halder, S.
AU - Palego, C.
AU - Molinero, D.
AU - Hwang, J.C.
AU - Goldsmith, C.L.
PY - 2012/6/17
Y1 - 2012/6/17
N2 - A CMOS control circuit capable of closed-loop capacitance sensing and control of RF MEMS switches was designed, fabricated, and tested. The control was based on fine-tuning the magnitude of the bias voltage of the switches according to the difference between sensed and targeted capacitances. Intelligence could be programmed by periodically alternating the sign of the bias voltage when its magnitude to maintain the targeted capacitance drifted significantly due to dielectric charging. Such an intelligent control could also be used to compensate for process variation, ambient temperature change, and RF power loading, which would make RF MEMS capacitive switches not only more reliable, but also more robust.
AB - A CMOS control circuit capable of closed-loop capacitance sensing and control of RF MEMS switches was designed, fabricated, and tested. The control was based on fine-tuning the magnitude of the bias voltage of the switches according to the difference between sensed and targeted capacitances. Intelligence could be programmed by periodically alternating the sign of the bias voltage when its magnitude to maintain the targeted capacitance drifted significantly due to dielectric charging. Such an intelligent control could also be used to compensate for process variation, ambient temperature change, and RF power loading, which would make RF MEMS capacitive switches not only more reliable, but also more robust.
U2 - 10.1109/MWSYM.2012.6257781
DO - 10.1109/MWSYM.2012.6257781
M3 - Paper
T2 - Microwave Symposium Digest (MTT), 2012 IEEE MTT-S International, Montreal, 17-22 June 2012
Y2 - 3 January 0001
ER -