Interface states and depletion-induced threshold voltage instability in organic metal-insulator-semiconductor structures
Research output: Contribution to journal › Article › peer-review
Electronic versions
DOI
Keywords
- PHYSICS, APPLIED
Original language | English |
---|---|
Pages (from-to) | 314-316 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 2 |
DOIs | |
Publication status | Published - 12 Jul 2004 |