Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.
Research output: Contribution to journal › Article › peer-review
Standard Standard
Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements. / Mabrook, M.F.; Jombert, A.S.; Machin, S.E. et al.
In: Materials Science and Engineering B, Vol. 159-160, 15.03.2009, p. 14-17.
In: Materials Science and Engineering B, Vol. 159-160, 15.03.2009, p. 14-17.
Research output: Contribution to journal › Article › peer-review
HarvardHarvard
Mabrook, MF, Jombert, AS, Machin, SE, Pearson, C, Kolb, D, Coleman, KS, Zeze, DA & Petty, MC 2009, 'Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.', Materials Science and Engineering B, vol. 159-160, pp. 14-17. https://doi.org/10.1016/j.mseb.2008.09.003
APA
Mabrook, M. F., Jombert, A. S., Machin, S. E., Pearson, C., Kolb, D., Coleman, K. S., Zeze, D. A., & Petty, M. C. (2009). Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements. Materials Science and Engineering B, 159-160, 14-17. https://doi.org/10.1016/j.mseb.2008.09.003
CBE
Mabrook MF, Jombert AS, Machin SE, Pearson C, Kolb D, Coleman KS, Zeze DA, Petty MC. 2009. Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements. Materials Science and Engineering B. 159-160:14-17. https://doi.org/10.1016/j.mseb.2008.09.003
MLA
Mabrook, M.F. et al. "Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.". Materials Science and Engineering B. 2009, 159-160. 14-17. https://doi.org/10.1016/j.mseb.2008.09.003
VancouverVancouver
Mabrook MF, Jombert AS, Machin SE, Pearson C, Kolb D, Coleman KS et al. Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements. Materials Science and Engineering B. 2009 Mar 15;159-160:14-17. doi: 10.1016/j.mseb.2008.09.003
Author
RIS
TY - JOUR
T1 - Memory effects in MIS structures based on silicon and polymethylmethacrylate with nanoparticle charge-storage elements.
AU - Mabrook, M.F.
AU - Jombert, A.S.
AU - Machin, S.E.
AU - Pearson, C.
AU - Kolb, D.
AU - Coleman, K.S.
AU - Zeze, D.A.
AU - Petty, M.C.
PY - 2009/3/15
Y1 - 2009/3/15
U2 - 10.1016/j.mseb.2008.09.003
DO - 10.1016/j.mseb.2008.09.003
M3 - Article
VL - 159-160
SP - 14
EP - 17
JO - Materials Science and Engineering B
JF - Materials Science and Engineering B
SN - 0921-5107
ER -