Standard Standard

Near-Edge X-ray Absorption Fine Structure Studies of Electrospun Poly(dimethylsiloxane)/Poly(methyl methacrylate)/Multiwall Carbon Nanotube Composites. / Campo, E.; Winter, A.D.; Larios, E. et al.
In: Langmuir, Vol. 29, No. 51, 05.12.2013, p. 15822-15830.

Research output: Contribution to journalArticlepeer-review

HarvardHarvard

Campo, E, Winter, AD, Larios, E, Alamgir, FM, Jaye, C, Fischer, D & Campo, EM 2013, 'Near-Edge X-ray Absorption Fine Structure Studies of Electrospun Poly(dimethylsiloxane)/Poly(methyl methacrylate)/Multiwall Carbon Nanotube Composites', Langmuir, vol. 29, no. 51, pp. 15822-15830. https://doi.org/10.1021/la404312x

APA

Campo, E., Winter, A. D., Larios, E., Alamgir, F. M., Jaye, C., Fischer, D., & Campo, E. M. (2013). Near-Edge X-ray Absorption Fine Structure Studies of Electrospun Poly(dimethylsiloxane)/Poly(methyl methacrylate)/Multiwall Carbon Nanotube Composites. Langmuir, 29(51), 15822-15830. https://doi.org/10.1021/la404312x

CBE

MLA

VancouverVancouver

Campo E, Winter AD, Larios E, Alamgir FM, Jaye C, Fischer D et al. Near-Edge X-ray Absorption Fine Structure Studies of Electrospun Poly(dimethylsiloxane)/Poly(methyl methacrylate)/Multiwall Carbon Nanotube Composites. Langmuir. 2013 Dec 5;29(51):15822-15830. doi: 10.1021/la404312x

Author

Campo, E. ; Winter, A.D. ; Larios, E. et al. / Near-Edge X-ray Absorption Fine Structure Studies of Electrospun Poly(dimethylsiloxane)/Poly(methyl methacrylate)/Multiwall Carbon Nanotube Composites. In: Langmuir. 2013 ; Vol. 29, No. 51. pp. 15822-15830.

RIS

TY - JOUR

T1 - Near-Edge X-ray Absorption Fine Structure Studies of Electrospun Poly(dimethylsiloxane)/Poly(methyl methacrylate)/Multiwall Carbon Nanotube Composites

AU - Campo, E.

AU - Winter, A.D.

AU - Larios, E.

AU - Alamgir, F.M.

AU - Jaye, C.

AU - Fischer, D.

AU - Campo, E.M.

PY - 2013/12/5

Y1 - 2013/12/5

U2 - 10.1021/la404312x

DO - 10.1021/la404312x

M3 - Article

VL - 29

SP - 15822

EP - 15830

JO - Langmuir

JF - Langmuir

SN - 0743-7463

IS - 51

ER -