On the measurement of the Pockels effect in strained silicon

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DOI

  • M. Nezhad
  • S.S. Azedeh
  • F. Merget
  • M.P. Nezhad
  • J. Witzens
Original languageEnglish
Pages (from-to)1877-1880
JournalOptics Letters
Volume40
Issue number8
DOIs
Publication statusPublished - 15 Apr 2015
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