Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate)

Research output: Contribution to journalArticlepeer-review

Standard Standard

Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate). / Sleiman, A.; Mabrook, M.F.; Nejm, R.R. et al.
In: Journal of Applied Physics, Vol. 112, 19.07.2012, p. 024509.

Research output: Contribution to journalArticlepeer-review

HarvardHarvard

Sleiman, A, Mabrook, MF, Nejm, RR, Ayesh, A, Al Ghaferi, A, Petty, MC & Zeze, DA 2012, 'Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate)', Journal of Applied Physics, vol. 112, pp. 024509. https://doi.org/10.1063/1.4737599

APA

Sleiman, A., Mabrook, M. F., Nejm, R. R., Ayesh, A., Al Ghaferi, A., Petty, M. C., & Zeze, D. A. (2012). Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate). Journal of Applied Physics, 112, 024509. https://doi.org/10.1063/1.4737599

CBE

Sleiman A, Mabrook MF, Nejm RR, Ayesh A, Al Ghaferi A, Petty MC, Zeze DA. 2012. Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate). Journal of Applied Physics. 112:024509. https://doi.org/10.1063/1.4737599

MLA

VancouverVancouver

Sleiman A, Mabrook MF, Nejm RR, Ayesh A, Al Ghaferi A, Petty MC et al. Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate). Journal of Applied Physics. 2012 Jul 19;112:024509. doi: 10.1063/1.4737599

Author

Sleiman, A. ; Mabrook, M.F. ; Nejm, R.R. et al. / Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate). In: Journal of Applied Physics. 2012 ; Vol. 112. pp. 024509.

RIS

TY - JOUR

T1 - Organic bistable devices utilizing carbon nanotubes embedded in poly(methyl methacrylate)

AU - Sleiman, A.

AU - Mabrook, M.F.

AU - Nejm, R.R.

AU - Ayesh, A.

AU - Al Ghaferi, A.

AU - Petty, M.C.

AU - Zeze, D.A.

PY - 2012/7/19

Y1 - 2012/7/19

N2 - The electrical and memory behavior of organic bistable memory devices in the form of metal-embedded insulator-metal (MIM) structure are described. The devices utilize layer-by-layer (LbL) deposited single walled carbon nanotubes (SWCNTs) as charge traps embedded between two polymethylmethacrylate (PMMA) insulating layers. The stack was sandwiched between two aluminium electrodes to form an Al/PMMA/SWCNTs/PMMA/Al structure. The current-voltage (I-V) characteristics of the devices exhibit electrical bistability and non-volatile memory characteristics in terms of switching between high conductive (ON) and low conductive (OFF) states. The different conductive states were programmed by application of a positive and negative voltage pulse for the ON and OFF states, respectively. A maximum ON/OFF ratio of 2 × 105 is achieved at low reading voltage of 1 V. Space-charge-limited-current (SCLC) conduction model was used to describe the carriers transport and the electrical bistability in the devices, which was attributed to the trapping and detrapping of electrons inside the SWCNTs.

AB - The electrical and memory behavior of organic bistable memory devices in the form of metal-embedded insulator-metal (MIM) structure are described. The devices utilize layer-by-layer (LbL) deposited single walled carbon nanotubes (SWCNTs) as charge traps embedded between two polymethylmethacrylate (PMMA) insulating layers. The stack was sandwiched between two aluminium electrodes to form an Al/PMMA/SWCNTs/PMMA/Al structure. The current-voltage (I-V) characteristics of the devices exhibit electrical bistability and non-volatile memory characteristics in terms of switching between high conductive (ON) and low conductive (OFF) states. The different conductive states were programmed by application of a positive and negative voltage pulse for the ON and OFF states, respectively. A maximum ON/OFF ratio of 2 × 105 is achieved at low reading voltage of 1 V. Space-charge-limited-current (SCLC) conduction model was used to describe the carriers transport and the electrical bistability in the devices, which was attributed to the trapping and detrapping of electrons inside the SWCNTs.

U2 - 10.1063/1.4737599

DO - 10.1063/1.4737599

M3 - Article

VL - 112

SP - 024509

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

ER -