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800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating. / Suo, Rui; Chen, Xianfeng; Zhou, Kaiming; Zhang, Lin; Bennion, Ian.

Yn: IEEE Sensors Journal, Cyfrol 8, Rhif 7, 01.07.2008, t. 1273-1279.

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Suo, Rui ; Chen, Xianfeng ; Zhou, Kaiming ; Zhang, Lin ; Bennion, Ian. / 800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating. Yn: IEEE Sensors Journal. 2008 ; Cyfrol 8, Rhif 7. tt. 1273-1279.

RIS

TY - JOUR

T1 - 800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating

AU - Suo, Rui

AU - Chen, Xianfeng

AU - Zhou, Kaiming

AU - Zhang, Lin

AU - Bennion, Ian

PY - 2008/7/1

Y1 - 2008/7/1

KW - optical sensing

KW - strain and temperature sensor

KW - tilted fiber Bragg grating (TFBG)

KW - wavelength-division-multiplexing (WDM) interrogation system

U2 - 10.1109/JSEN.2008.926527

DO - 10.1109/JSEN.2008.926527

M3 - Article

VL - 8

SP - 1273

EP - 1279

JO - IEEE Sensors Journal

JF - IEEE Sensors Journal

SN - 1530-437X

IS - 7

ER -