Standard Standard

800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating. / Suo, Rui; Chen, Xianfeng; Zhou, Kaiming et al.
In: IEEE Sensors Journal, Vol. 8, No. 7, 01.07.2008, p. 1273-1279.

Research output: Contribution to journalArticlepeer-review

HarvardHarvard

Suo, R, Chen, X, Zhou, K, Zhang, L & Bennion, I 2008, '800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating', IEEE Sensors Journal, vol. 8, no. 7, pp. 1273-1279. https://doi.org/10.1109/JSEN.2008.926527

APA

CBE

MLA

VancouverVancouver

Suo R, Chen X, Zhou K, Zhang L, Bennion I. 800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating. IEEE Sensors Journal. 2008 Jul 1;8(7):1273-1279. doi: 10.1109/JSEN.2008.926527

Author

Suo, Rui ; Chen, Xianfeng ; Zhou, Kaiming et al. / 800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating. In: IEEE Sensors Journal. 2008 ; Vol. 8, No. 7. pp. 1273-1279.

RIS

TY - JOUR

T1 - 800 nm WDM interrogation system for strain, temperature, and refractive index sensing based on tilted fiber Bragg grating

AU - Suo, Rui

AU - Chen, Xianfeng

AU - Zhou, Kaiming

AU - Zhang, Lin

AU - Bennion, Ian

PY - 2008/7/1

Y1 - 2008/7/1

KW - optical sensing

KW - strain and temperature sensor

KW - tilted fiber Bragg grating (TFBG)

KW - wavelength-division-multiplexing (WDM) interrogation system

U2 - 10.1109/JSEN.2008.926527

DO - 10.1109/JSEN.2008.926527

M3 - Article

VL - 8

SP - 1273

EP - 1279

JO - IEEE Sensors Journal

JF - IEEE Sensors Journal

SN - 1530-437X

IS - 7

ER -