Fersiynau electronig

Dangosydd eitem ddigidol (DOI)

  • D. Molinero
  • C. Palego
  • S. Halder
  • X. Luo
  • A. Hallden-Abberton
  • J. Hwang
  • C.L. Goldsmith
RF power, when approaching the handling capacity of microelectromechanical capacitive switches, was found to accelerate both the charging and discharging of the dielectric in the switches. The amount of acceleration appeared to be greater than what could be explained by self biasing and self heating. Since the long-term reliability of the switches is limited by dielectric charging, the RF power-handling capacity of the switches may have to be derated to ensure long-term reliability.
Iaith wreiddiolSaesneg
Dynodwyr Gwrthrych Digidol (DOIs)
StatwsCyhoeddwyd - 5 Meh 2011
DigwyddiadMicrowave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011 -
Hyd: 3 Ion 0001 → …

Cynhadledd

CynhadleddMicrowave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011
Cyfnod3/01/01 → …
Gweld graff cysylltiadau