Electronic versions

  • D. Molinero
  • C. Palego
  • S. Halder
  • X. Luo
  • A. Hallden-Abberton
  • J. Hwang
  • C.L. Goldsmith
RF power, when approaching the handling capacity of microelectromechanical capacitive switches, was found to accelerate both the charging and discharging of the dielectric in the switches. The amount of acceleration appeared to be greater than what could be explained by self biasing and self heating. Since the long-term reliability of the switches is limited by dielectric charging, the RF power-handling capacity of the switches may have to be derated to ensure long-term reliability.
Original languageEnglish
DOIs
Publication statusPublished - 5 Jun 2011
EventMicrowave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011 -
Duration: 3 Jan 0001 → …

Conference

ConferenceMicrowave Symposium Digest (MTT), 2011 IEEE MTT-S International, Baltimore, USA, 5-10 June 2011
Period3/01/01 → …
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