Effect of surface conduction on dielectric charging in RF MEMS capacitive switches
Allbwn ymchwil: Cyfraniad at gynhadledd › Papur
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2010. 1250-1253 Papur a gyflwynwyd yn Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International, Anaheim, USA, 23-28 May 2010.
Allbwn ymchwil: Cyfraniad at gynhadledd › Papur
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T1 - Effect of surface conduction on dielectric charging in RF MEMS capacitive switches
AU - Peng, Z.
AU - Molinero, D.
AU - Palego, C.
AU - Hwang, J.
AU - Moody, C.
AU - Malczewski, A.
AU - Pillans, B.W.
PY - 2010/5/23
Y1 - 2010/5/23
N2 - Charging of the surface of the dielectric in electrostatically actuated RF MEMS capacitive switches has been shown to be strongly affected by ambient humidity. We now hypothesize that the humidity affects surface charging through enhanced surface conduction. This is confirmed by the experimental results obtained on surface conductivity sensors and RF MEMS capacitive switches fabricated on the same die. The results suggest that it is critical to not only minimize the humidity in the switch package, but also optimize the surface chemistry of the switch dielectric to reduce its surface conductivity.
AB - Charging of the surface of the dielectric in electrostatically actuated RF MEMS capacitive switches has been shown to be strongly affected by ambient humidity. We now hypothesize that the humidity affects surface charging through enhanced surface conduction. This is confirmed by the experimental results obtained on surface conductivity sensors and RF MEMS capacitive switches fabricated on the same die. The results suggest that it is critical to not only minimize the humidity in the switch package, but also optimize the surface chemistry of the switch dielectric to reduce its surface conductivity.
U2 - 10.1109/MWSYM.2010.5515661
DO - 10.1109/MWSYM.2010.5515661
M3 - Paper
SP - 1250
EP - 1253
T2 - Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International, Anaheim, USA, 23-28 May 2010
Y2 - 3 January 0001
ER -