Porth Ymchwil

Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry

Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

StandardStandard

Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. / Kettle, Jeffrey.
Yn: Talanta, Cyfrol 192, 15.01.2019, t. 317-324.

Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

HarvardHarvard

Kettle, J 2019, 'Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry', Talanta, cyfrol. 192, tt. 317-324. https://doi.org/10.1016/j.talanta.2018.09.059

APA

Kettle, J. (2019). Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Talanta, 192, 317-324. https://doi.org/10.1016/j.talanta.2018.09.059

CBE

Kettle J. 2019. Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Talanta. 192:317-324. https://doi.org/10.1016/j.talanta.2018.09.059

MLA

Kettle, Jeffrey. "Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry". Talanta. 2019, 192. 317-324. https://doi.org/10.1016/j.talanta.2018.09.059

VancouverVancouver

Kettle J. Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Talanta. 2019 Ion 15;192:317-324. Epub 2018 Medi 18. doi: 10.1016/j.talanta.2018.09.059

Author

Kettle, Jeffrey. / Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Yn: Talanta. 2019 ; Cyfrol 192. tt. 317-324.

RIS

TY - JOUR

T1 - Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry

AU - Kettle, Jeffrey

PY - 2019/1/15

Y1 - 2019/1/15

KW - Depth profile analysis

KW - Perovskite solar cells

KW - Radiofrequency pulsed glow discharge

KW - Thin film solar cells

KW - Time of flight mass spectrometry

U2 - 10.1016/j.talanta.2018.09.059

DO - 10.1016/j.talanta.2018.09.059

M3 - Article

VL - 192

SP - 317

EP - 324

JO - Talanta

JF - Talanta

SN - 0039-9140

ER -