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Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry

Research output: Contribution to journal › Article › peer-review

Standard Standard

Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. / Kettle, Jeffrey.
In: Talanta, Vol. 192, 15.01.2019, p. 317-324.

Research output: Contribution to journal › Article › peer-review

HarvardHarvard

Kettle, J 2019, 'Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry', Talanta, vol. 192, pp. 317-324. https://doi.org/10.1016/j.talanta.2018.09.059

APA

Kettle, J. (2019). Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Talanta, 192, 317-324. https://doi.org/10.1016/j.talanta.2018.09.059

CBE

Kettle J. 2019. Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Talanta. 192:317-324. https://doi.org/10.1016/j.talanta.2018.09.059

MLA

Kettle, Jeffrey. "Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry". Talanta. 2019, 192. 317-324. https://doi.org/10.1016/j.talanta.2018.09.059

VancouverVancouver

Kettle J. Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. Talanta. 2019 Jan 15;192:317-324. Epub 2018 Sept 18. doi: 10.1016/j.talanta.2018.09.059

Author

Kettle, Jeffrey. / Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry. In: Talanta. 2019 ; Vol. 192. pp. 317-324.

RIS

TY - JOUR

T1 - Rapid evaluation of different Perovskite absorber layers through the application of depth profile analysis using Glow Discharge - Time of Flight Mass Spectrometry

AU - Kettle, Jeffrey

PY - 2019/1/15

Y1 - 2019/1/15

KW - Depth profile analysis

KW - Perovskite solar cells

KW - Radiofrequency pulsed glow discharge

KW - Thin film solar cells

KW - Time of flight mass spectrometry

U2 - 10.1016/j.talanta.2018.09.059

DO - 10.1016/j.talanta.2018.09.059

M3 - Article

VL - 192

SP - 317

EP - 324

JO - Talanta

JF - Talanta

SN - 0039-9140

ER -