Small-signal admittance measurements: A diagnostic tool for organic electronic devices.

Allbwn ymchwil: Cyfraniad at gynhadledd › Papur

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Small-signal admittance measurements: A diagnostic tool for organic electronic devices. / Taylor, D.M.
2009. Papur a gyflwynwyd yn Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

Allbwn ymchwil: Cyfraniad at gynhadledd › Papur

HarvardHarvard

Taylor, DM 2009, 'Small-signal admittance measurements: A diagnostic tool for organic electronic devices.', Papur a gyflwynwyd yn Proc. Symposium N, ICMAT 2009, Singapore June/July 2009., 3/01/01.

APA

Taylor, D. M. (2009). Small-signal admittance measurements: A diagnostic tool for organic electronic devices.. Papur a gyflwynwyd yn Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

CBE

Taylor DM. 2009. Small-signal admittance measurements: A diagnostic tool for organic electronic devices. Papur a gyflwynwyd yn Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

MLA

Taylor, D.M. Small-signal admittance measurements: A diagnostic tool for organic electronic devices.. Proc. Symposium N, ICMAT 2009, Singapore June/July 2009., 03 Ion 0001, Papur, 2009.

VancouverVancouver

Taylor DM. Small-signal admittance measurements: A diagnostic tool for organic electronic devices.. 2009. Papur a gyflwynwyd yn Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

Author

Taylor, D.M. / Small-signal admittance measurements: A diagnostic tool for organic electronic devices. Papur a gyflwynwyd yn Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

RIS

TY - CONF

T1 - Small-signal admittance measurements: A diagnostic tool for organic electronic devices.

AU - Taylor, D.M.

PY - 2009/1/1

Y1 - 2009/1/1

M3 - Paper

T2 - Proc. Symposium N, ICMAT 2009, Singapore June/July 2009.

Y2 - 3 January 0001

ER -