Small-signal admittance measurements: A diagnostic tool for organic electronic devices.

Research output: Contribution to conference › Paper

Standard Standard

Small-signal admittance measurements: A diagnostic tool for organic electronic devices. / Taylor, D.M.
2009. Paper presented at Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

Research output: Contribution to conference › Paper

HarvardHarvard

Taylor, DM 2009, 'Small-signal admittance measurements: A diagnostic tool for organic electronic devices.', Paper presented at Proc. Symposium N, ICMAT 2009, Singapore June/July 2009., 3/01/01.

APA

Taylor, D. M. (2009). Small-signal admittance measurements: A diagnostic tool for organic electronic devices.. Paper presented at Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

CBE

Taylor DM. 2009. Small-signal admittance measurements: A diagnostic tool for organic electronic devices. Paper presented at Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

MLA

Taylor, D.M. Small-signal admittance measurements: A diagnostic tool for organic electronic devices.. Proc. Symposium N, ICMAT 2009, Singapore June/July 2009., 03 Jan 0001, Paper, 2009.

VancouverVancouver

Taylor DM. Small-signal admittance measurements: A diagnostic tool for organic electronic devices.. 2009. Paper presented at Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

Author

Taylor, D.M. / Small-signal admittance measurements: A diagnostic tool for organic electronic devices. Paper presented at Proc. Symposium N, ICMAT 2009, Singapore June/July 2009..

RIS

TY - CONF

T1 - Small-signal admittance measurements: A diagnostic tool for organic electronic devices.

AU - Taylor, D.M.

PY - 2009/1/1

Y1 - 2009/1/1

M3 - Paper

T2 - Proc. Symposium N, ICMAT 2009, Singapore June/July 2009.

Y2 - 3 January 0001

ER -