Determining the interfacial density of states in metal-insulator-semiconductor devices based on poly(3-hexylthiophene)

Research output: Contribution to journal › Article › peer-review

Electronic versions

DOI

https://doi.org/10.1063/1.2897238
Final published version

D.M. Taylor
N. Alves

Keywords

PHYSICS, APPLIED

Original language	English
Pages (from-to)	103312
Journal	Applied Physics Letters
Volume	92
Issue number	10
DOIs	https://doi.org/10.1063/1.2897238
Publication status	Published - 13 Mar 2008

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