Standard Standard

Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. / Lee, R.S. (Inventor); Pethig, R. (Inventor); Talary, M.S. (Inventor).
Patent No.: US 7,063,777 B1. Jan 01, 2006.

Research output: Patent

HarvardHarvard

Lee, RS, Pethig, R & Talary, MS Jan. 01 2006, Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505, Patent No. US 7,063,777 B1.

APA

Lee, R. S., Pethig, R., & Talary, M. S. (2006). Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. (Patent No. US 7,063,777 B1).

CBE

Lee RS, Pethig R, Talary MS, inventors. 2006 Jan 01. Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. Patent No. US 7,063,777 B1.

MLA

Lee, R.S., R. Pethig and M.S. Talary, . 2006. Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. Patent No. US 7,063,777 B1.

VancouverVancouver

Lee RS, Pethig R, Talary MS, inventors. Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. US 7,063,777 B1. 2006 Jan 1.

Author

Lee, R.S. (Inventor) ; Pethig, R. (Inventor) ; Talary, M.S. (Inventor). / Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. Patent No.: US 7,063,777 B1. Jan 01, 2006.

RIS

TY - PAT

T1 - Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505

AU - Lee, R.S.

AU - Pethig, R.

AU - Talary, M.S.

PY - 2006/1/1

Y1 - 2006/1/1

UR - http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=7,063,777.PN.&OS=PN/7,063,777&RS=PN/7,063,777

M3 - Patent

M1 - US 7,063,777 B1

ER -