Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505
Research output: Patent
Standard Standard
Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. / Lee, R.S. (Inventor); Pethig, R. (Inventor); Talary, M.S. (Inventor).
Patent No.: US 7,063,777 B1. Jan 01, 2006.
Patent No.: US 7,063,777 B1. Jan 01, 2006.
Research output: Patent
HarvardHarvard
Lee, RS, Pethig, R & Talary, MS Jan. 01 2006, Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505, Patent No. US 7,063,777 B1.
APA
Lee, R. S., Pethig, R., & Talary, M. S. (2006). Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. (Patent No. US 7,063,777 B1).
CBE
Lee RS, Pethig R, Talary MS, inventors. 2006 Jan 01. Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. Patent No. US 7,063,777 B1.
MLA
Lee, R.S., R. Pethig and M.S. Talary, . 2006. Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. Patent No. US 7,063,777 B1.
VancouverVancouver
Lee RS, Pethig R, Talary MS, inventors. Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505. US 7,063,777 B1. 2006 Jan 1.
Author
RIS
TY - PAT
T1 - Dielectrophoretic Particle Profiling System and Method. PCT/ WO 04/055505
AU - Lee, R.S.
AU - Pethig, R.
AU - Talary, M.S.
PY - 2006/1/1
Y1 - 2006/1/1
UR - http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=7,063,777.PN.&OS=PN/7,063,777&RS=PN/7,063,777
M3 - Patent
M1 - US 7,063,777 B1
ER -