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Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging

Research output: Contribution to journal › Article › peer-review

Standard Standard

Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging. / Vidal, F.P.; Letang, J.M.; Peix, G. et al.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 234, No. 3, 01.06.2005, p. 333-348.

Research output: Contribution to journal › Article › peer-review

HarvardHarvard

Vidal, FP, Letang, JM, Peix, G & Cloetens, P 2005, 'Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging', Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, vol. 234, no. 3, pp. 333-348. https://doi.org/10.1016/j.nimb.2005.02.003

APA

Vidal, F. P., Letang, J. M., Peix, G., & Cloetens, P. (2005). Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 234(3), 333-348. https://doi.org/10.1016/j.nimb.2005.02.003

CBE

Vidal FP, Letang JM, Peix G, Cloetens P. 2005. Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 234(3):333-348. https://doi.org/10.1016/j.nimb.2005.02.003

MLA

Vidal, F.P. et al. "Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2005, 234(3). 333-348. https://doi.org/10.1016/j.nimb.2005.02.003

VancouverVancouver

Vidal FP, Letang JM, Peix G, Cloetens P. Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2005 Jun 1;234(3):333-348. doi: 10.1016/j.nimb.2005.02.003

Author

Vidal, F.P. ; Letang, J.M. ; Peix, G. et al. / Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging. In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2005 ; Vol. 234, No. 3. pp. 333-348.

RIS

TY - JOUR

T1 - Investigation of artefact sources in synchrotron microtomography via virtual X-ray imaging

AU - Vidal, F.P.

AU - Letang, J.M.

AU - Peix, G.

AU - Cloetens, P.

PY - 2005/6/1

Y1 - 2005/6/1

KW - INSTRUMENTS & INSTRUMENTATION

KW - NUCLEAR SCIENCE & TECHNOLOGY

KW - PHYSICS

KW - ATOMIC

KW - MOLECULAR & CHEMICAL

KW - NUCLEAR

U2 - 10.1016/j.nimb.2005.02.003

DO - 10.1016/j.nimb.2005.02.003

M3 - Article

VL - 234

SP - 333

EP - 348

JO - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

SN - 0168-583X

IS - 3

ER -