Modelling the response of x-ray detectors and removing artefacts in 3D tomography
Research output: Other contribution › peer-review
Electronic versions
This work presents a method for modelling the response of X-ray detectors applied to remove artefacts in tomography. On some reconstructed volumes by tomography using synchrotron radiations at ESRF, dark line artefacts (under-estimation of linear attenuation coefficients) appear when high density material are aligned. The causes of these artefacts have been determined using experimental and simulation methods; then simulated artefacts were removed. Finally two different causes are highlighted in this study. One of them is the impulse response of the used detector, the Frelon camera of ID19 beamline. An iterative fixed point algorithm has been used successfully to remove simulated artefacts on tomographic slices.
Keywords
- tomography, X-ray, detectors response modelling, artefacts, simulation, deconvolution
| Original language | English |
|---|---|
| Type | Masters by Research |
| Medium of output | Supervisor: J.M. Letang |
| Publisher | Institut National des Sciences Appliquées de Lyon |
| Publication status | Published - Sept 2003 |
Research outputs (1)
- Published
Use of fast realistic simulations on GPU to extract CAD models from microtomographic data in the presence of strong CT artefacts
Research output: Contribution to journal › Article › peer-review
Prof. activities and awards (1)
Optimisation and Simulation of X-ray images: Automatic registration of surface models on synchrotron microtomography data
Activity: Talk or presentation › Oral presentation