Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes
Research output: Contribution to journal › Article › peer-review
Standard Standard
Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes. / Palego, Cristiano; Deng, Jie; Peng, Zhen et al.
In: IEEE Transactions on Microwave Theory and Techniques, Vol. 57, No. 12, 10.11.2009, p. 3262-3269.
In: IEEE Transactions on Microwave Theory and Techniques, Vol. 57, No. 12, 10.11.2009, p. 3262-3269.
Research output: Contribution to journal › Article › peer-review
HarvardHarvard
Palego, C, Deng, J, Peng, Z, Halder, S, Hwang, JCM, Forehand, DI, Scarbrough, D, Goldsmith, CL, Johnston, I, Sampath, SK & Datta, A 2009, 'Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes', IEEE Transactions on Microwave Theory and Techniques, vol. 57, no. 12, pp. 3262-3269. https://doi.org/10.1109/TMTT.2009.2033885
APA
Palego, C., Deng, J., Peng, Z., Halder, S., Hwang, J. C. M., Forehand, D. I., Scarbrough, D., Goldsmith, C. L., Johnston, I., Sampath, S. K., & Datta, A. (2009). Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes. IEEE Transactions on Microwave Theory and Techniques, 57(12), 3262-3269. https://doi.org/10.1109/TMTT.2009.2033885
CBE
Palego C, Deng J, Peng Z, Halder S, Hwang JCM, Forehand DI, Scarbrough D, Goldsmith CL, Johnston I, Sampath SK, et al. 2009. Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes. IEEE Transactions on Microwave Theory and Techniques. 57(12):3262-3269. https://doi.org/10.1109/TMTT.2009.2033885
MLA
Palego, Cristiano et al. "Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes". IEEE Transactions on Microwave Theory and Techniques. 2009, 57(12). 3262-3269. https://doi.org/10.1109/TMTT.2009.2033885
VancouverVancouver
Palego C, Deng J, Peng Z, Halder S, Hwang JCM, Forehand DI et al. Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes. IEEE Transactions on Microwave Theory and Techniques. 2009 Nov 10;57(12):3262-3269. doi: 10.1109/TMTT.2009.2033885
Author
RIS
TY - JOUR
T1 - Robustness of RF MEMS Capacitive Switches With Molybdenum Membranes
AU - Palego, Cristiano
AU - Deng, Jie
AU - Peng, Zhen
AU - Halder, Subrata
AU - Hwang, James C. M.
AU - Forehand, David I.
AU - Scarbrough, Derek
AU - Goldsmith, Charles L.
AU - Johnston, Ian
AU - Sampath, Suresh K.
AU - Datta, Arindom
PY - 2009/11/10
Y1 - 2009/11/10
U2 - 10.1109/TMTT.2009.2033885
DO - 10.1109/TMTT.2009.2033885
M3 - Article
VL - 57
SP - 3262
EP - 3269
JO - IEEE Transactions on Microwave Theory and Techniques
JF - IEEE Transactions on Microwave Theory and Techniques
SN - 0018-9480
IS - 12
ER -