Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors

Research output: Contribution to journal › Article › peer-review

Electronic versions

DOI

https://doi.org/10.1063/1.2844435
Final published version

D.M. Taylor
N. Alves

Keywords

PHYSICS, APPLIED

Original language	English
Pages (from-to)	054509
Journal	Journal of Applied Physics
Volume	103
Issue number	5
DOIs	https://doi.org/10.1063/1.2844435
Publication status	Published - 10 Mar 2008

View graph of relations