Super-Enhancement Focusing of Teflon Spheres
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In: Annalen der Physik, Vol. 532, No. 10, 2000373, 09.10.2020.
Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Super-Enhancement Focusing of Teflon Spheres
AU - Yue, Liyang
AU - Wang, James
AU - Yan, Bing
AU - Monks, James
AU - Joya, Yasir
AU - Dhama, Rakesh
AU - Minin, Oleg
AU - Minin, Igor
PY - 2020/10/9
Y1 - 2020/10/9
N2 - A Teflon (Polytetrafluoroethylene, PTFE) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz (THz) band. In this paper, we analytically calculated field intensities and focusing parameters for Teflon spheres at different low-loss levels and then discovered a super-enhancement focusing effect in the spheres with particular size parameters, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proved that the strong scattering of a single order mode in the internal electric or magnetic field is the main factor causing this phenomenon.
AB - A Teflon (Polytetrafluoroethylene, PTFE) sphere can be used as a focusing lens in the applications of imaging and sensing due to its low-loss property in the terahertz (THz) band. In this paper, we analytically calculated field intensities and focusing parameters for Teflon spheres at different low-loss levels and then discovered a super-enhancement focusing effect in the spheres with particular size parameters, which can stimulate about 4000 times stronger field intensity than that for incident radiation as well as the great potential of overcoming diffraction limit despite high sensitivity to the magnitude of Teflon loss. A subsequent analysis of scattering amplitudes proved that the strong scattering of a single order mode in the internal electric or magnetic field is the main factor causing this phenomenon.
KW - Mie theory
KW - Teflon spheres
KW - dielectric particles
KW - low-loss materials
KW - near-field focusing
U2 - 10.1002/andp.202000373
DO - 10.1002/andp.202000373
M3 - Article
VL - 532
JO - Annalen der Physik
JF - Annalen der Physik
SN - 1521-3889
IS - 10
M1 - 2000373
ER -